dc.contributor.author | DONEGAN, JOHN | en |
dc.contributor.author | LU, QIAOYIN | en |
dc.contributor.author | GUO, WEI-HUA | en |
dc.date.accessioned | 2009-09-22T09:32:52Z | |
dc.date.available | 2009-09-22T09:32:52Z | |
dc.date.issued | 2008 | en |
dc.date.submitted | 2008 | en |
dc.identifier.citation | Guo, W.H. Byrne, D. Lu, Q.Y. Donegan, J.F., Waveguide Loss Measurement Using the Reflection Spectrum, Photonics Technology Letters, 20, 1685, 2008, 1423-1425 | en |
dc.identifier.other | Y | en |
dc.description | PUBLISHED | en |
dc.description.abstract | A method for waveguide loss measurement purely
based on the reflection spectrum is proposed. Using the Fourier
series expansion of the single longitudinal mode in the reflection
spectrum, the ratio between the second and first harmonics gives
the round-trip loss even when the reflection coefficient of the
launching optical field directly reflected by the waveguide facet
is unknown. The internal loss of a Fabry?Perot laser diode was
measured by the proposed method with results which compare
well with those estimated from the amplified spontaneous emission
spectrum. | en |
dc.description.sponsorship | The authors would like to thank Eblana Photonics for providing
the FP laser diode used in the measurement. | en |
dc.format.extent | 1423-1425 | en |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.relation.ispartofseries | Photonics Technology Letters | en |
dc.relation.ispartofseries | 20 | en |
dc.relation.ispartofseries | 1685 | en |
dc.rights | Y | en |
dc.subject | Amplified spontaneous emission (ASE), Fourier series expansion, reflection spectrum, waveguide loss. | en |
dc.title | Waveguide Loss Measurement Using the Reflection Spectrum | en |
dc.type | Journal Article | en |
dc.type.supercollection | scholarly_publications | en |
dc.type.supercollection | refereed_publications | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/jdonegan | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/guow | en |
dc.identifier.rssinternalid | 61055 | en |
dc.identifier.doi | http://dx.doi.org/10.1109/LPT.2008.927885 | en |
dc.identifier.rssuri | http://dx.doi.org/10.1109/LPT.2008.927885 | |
dc.identifier.orcid_id | 0000-0002-5240-1434 | en |
dc.identifier.uri | http://hdl.handle.net/2262/33050 | |