General approach to the analysis of plasmonic structures using spectroscopic ellipsometry
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Journal ArticleDate:
2013Access:
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R. Verre, M. Modreanu, O. Ualibek, D. Fox, K. Fleischer, C. Smith, H. Zhang, M. Pemble, J. F. McGilp, and I. V. Shvets, General approach to the analysis of plasmonic structures using spectroscopic ellipsometry, Physical Review B, 87, 23, 2013, 235428-Download Item:
Abstract:
In this article a route to analyze the full optical response of plasmonic structures is developed. First, the simple
case of an anisotropic thin plasmonic layer supported on a transparent substrate is analyzed by introducing
a quantity named anisotropic surface excess function (ASEF). The spectral features are analyzed in terms of
effective dielectric function, demonstrating a more direct relation with the plasmonic response of the layer.
The formalism is then generalized using a transfer matrix method. The formalism developed is supported by
experimental evidence obtained by measuring the response of anisotropic nanoparticle arrays grown at a glancing
angle. The agreement between theory and experiment is clear, suggesting that SE can be conveniently employed
to measure the spectroscopic response of plasmonic structures. It is also demonstrated that the figure of merit
of the plasmonic resonance for refractive index sensing can be greatly improved, with optimized measurement
configurations, using polarized spectroscopy.
Sponsor
Grant Number
Science Foundation Ireland (SFI)
11/RFP.1/PHY/3047
Science Foundation Ireland (SFI)
06/IN.1/I91
Author's Homepage:
http://people.tcd.ie/fleisckhttp://people.tcd.ie/hozhang
http://people.tcd.ie/foxd6
http://people.tcd.ie/chsmith
http://people.tcd.ie/ivchvets
http://people.tcd.ie/jmcgilp
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PUBLISHED
Author: FOX, DANIEL; FLEISCHER, KARSTEN; SMITH, CHRISTOPHER; ZHANG, HONGZHOU; MCGILP, JOHN; SHVETS, IGOR
Sponsor:
Science Foundation Ireland (SFI)Science Foundation Ireland (SFI)
Type of material:
Journal ArticleCollections
Series/Report no:
Physical Review B87
23
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Full text availableKeywords:
localised plasmon resonance, spectroscopic ellipsometry, nanoparticle arrays, surface excess functionSubject (TCD):
Nanoscience & MaterialsDOI:
http://dx.doi.org/10.1103/PhysRevB.87.235428Metadata
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