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dc.contributor.authorVenkatesan, Munuswamy
dc.contributor.authorCoey, John
dc.date.accessioned2023-01-16T16:58:16Z
dc.date.available2023-01-16T16:58:16Z
dc.date.issued2022
dc.date.submitted2022en
dc.identifier.citationYao Guang, Like Zhang, Junwei Zhang, Yadong Wang, Yuelei Zhao, Riccardo Tomasello, Senfu Zhang, Bin He, Jiahui Li, Yizhou Liu, Jiafeng Feng, Hongxiang Wei, Mario Carpentieri, Zhipeng Hou, Junming Liu, Yong Peng, Zhongming Zeng, Giovanni Finocchio, Xixiang Zhang, John Michael David Coey, Xiufeng Han, and Guoqiang Yu, Electrical detection of magnetic skyrmyons in a magnetic tunnel junction, Advanced Electronic Materials, 9, 2022, 2200570en
dc.identifier.issn2199-160X
dc.identifier.otherY
dc.descriptionPUBLISHEDen
dc.description.abstractMagnetic skyrmions are promising information carriers for dense and energy-efficient information storage owing to their small size, low driving-current density, and topological stability. Electrical detection of skyrmions is a crucial requirement to drive skyrmion devices toward applications. The use of a magnetic tunnel junction (MTJ) is commonly suggested for this purpose as MTJs are key spintronic devices for large-scale commercialization that can convert magnetic textures into electrical signals. To date, however, it has been challenging to realize skyrmions in MTJs due to incompatibility between standard skyrmion materials and highly efficient MTJ electrodes. Here, a material stack combining magnetic multilayers, which host 100 nm scale skyrmions, with a perpendicularly magnetized MTJ, is reported. The devices are designed so that the skyrmions in the multilayer are imprinted into the MTJ's free layer via magnetostatic interactions. The electrical response of a single skyrmion is successfully identified by employing simultaneous imaging of the magnetic texture and the electrical measurement of the MTJ resistance. The results are an important step toward all-electrical detection of skyrmions.en
dc.format.extent2200570en
dc.language.isoenen
dc.relation.ispartofseriesAdvanced Electronic Materials;
dc.relation.ispartofseries9;
dc.rightsYen
dc.subjectelectron beam lithographyen
dc.subjectmagnetic skyrmionsen
dc.subjectmagnetic tunnel junctionen
dc.subjectskyrmion latticeen
dc.subjecttransmission electron microscopyen
dc.titleElectrical detection of magnetic skyrmyons in a magnetic tunnel junctionen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/venkatem
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jcoey
dc.identifier.rssinternalid250063
dc.identifier.doi10.1002/aelm.202200570
dc.rights.ecaccessrightsopenAccess
dc.relation.doi10.1002/aelm.202200570en
dc.relation.sourceWiley-VCH GmbHen
dc.relation.citesCitesen
dc.subject.TCDTagApplied physicsen
dc.subject.TCDTagCondensed matter, electronic, magnetic and superconductive propertiesen
dc.subject.TCDTagMagnetism and spin electronicsen
dc.subject.TCDTagNanotechnologyen
dc.relation.sourceurihttps://onlinelibrary.wiley.com/doi/pdf/10.1002/aelm.202200570en
dc.status.accessibleNen
dc.contributor.sponsorScience Foundation of Chinaen
dc.contributor.sponsorGrantNumberZ190009en
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.contributor.sponsorGrantNumber16/IA/4534 ZEMS, 12/RC/2278 AMBERen
dc.contributor.sponsorNational Natural Science Foundation of China (60703033).en
dc.contributor.sponsorGrantNumber11874409, 52161160334, 12174426en
dc.identifier.urihttp://hdl.handle.net/2262/101986


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