Show simple item record

dc.contributor.advisorDonegan, John
dc.contributor.authorMickus, Dovydas
dc.date.accessioned2023-06-22T10:46:52Z
dc.date.available2023-06-22T10:46:52Z
dc.date.issued2023en
dc.date.submitted2023
dc.identifier.citationMickus, Dovydas, Athermalisation and Characterisation of High-OrderSurface Grating Lasers for Optical Communications, Trinity College Dublin, School of Physics, Physics, 2023en
dc.identifier.otherYen
dc.descriptionAPPROVEDen
dc.description.abstractThe semiconductor laser allows for the vast quantities of data that are transmitted over optical fibre each day. A simple device has transformed our lives. This transformation will continue in the coming decade where the rapid growth of high-speed data transmission services is increasing the de- mand for bandwidth and continual industry innovation is needed to meet this challenge. For the optical access networks, next generation passive optical networks version 2 (NGPON2) is an ambitious ITU standard developed to drive such innovation. Time and wavelength division multiplexing (TWDM) has been chosen for the NGPON2 standard. These NGPON2 transmitters will be used in fibre-to-the-x (FTTx), including fibre-to-the-home (FTTH) systems and hence are to be deployed to every customers premises. Such wide network deployment places an extremely high level of importance on transceiver cost reduction – which can be achieved through the simplification of the manufacturing process. Currently, distributed feedback (DFB) lasers and distributed Bragg reflector (DBR) lasers with buried low order gratings are the focus of TWDM research. However, fabrication of these lasers requires complex regrowth steps and precise e-beam lithography which invariably drives yield down and costs up. Previous research in the Trinity College Dublin semiconductor photonics group has yielded low-cost laser designs based on high-order surfaced etched slots for the devices grating structure, which can forgo regrowth steps and use inexpensive optical lithography. The research presented in this thesis builds upon the work previously performed on these devices. In addition to low cost requirements, there is a significant reduction of channel spacing, which in turn requires increased wavelength stability of transmitters. This is challenging to achieve since the emission wavelength of lasers is inherently temperature sensitive, and many applications use lasers in a variable high-temperature environment such as in data centres. Similarly, for pumping resonators for broadband comb generation, wavelength stability versus temperature is critical. Currently, thermoelectric coolers (TEC) are used to maintain a stable device temperature however, their energy efficiency and tuning precision are relatively low. Furthermore, their addition increases packaging costs and reduces package lifetime. Instead, semiconductor lasers can be athermalised, making their lasing wavelength insensitive to changes in ambient temperature by varying injection currents across laser sections, which would allow the removal of the TEC, improving overall energy effi- ciency, reducing packaging costs and increasing package lifetime. There has been significant athermalisation research stemming from our group and else where, and this work significantly builds upon it. First, extensive character- isation of our existing devices is performed in steady state conditions with the aim of choosing a device which is capable of wide range athermalisation. Results from this yields that 700 μm long devices that have a Bragg peak which is misaligned with the gain peak by approximately +20 to 25 nm yield would yield the best results. The chosen device is then continuously athermalised over a range of 5 to 106 oC, while maintaining a frequency stability of ±0.4 GHz and SMSR above 30 dB. This athermalisation scheme was then extended to multiples wavelengths from the same device, with thorough analysis of device parameter change over the athermal path versus wavelength. As a natural consequence of these measurements, a new method to measure thermal impedance of all-active active devices has been developed, measuring the thermal impedance length product of our devices as 29.3±2.1 oC μm/mW for the gain section and 39.33±2.8 oC μm/mW for the grating section. TWDM transmitters must also be capable of pulsed mode operation, meeting the same requirements mentioned above. This requirement is challenging to meet due to the large, time dependent thermal frequency drift which occurs during pulses which is caused by the laser self-heating. The devices under this research have not been extensively tested under transient conditions and thus pulsed mode characterisation has been performed. It was found that 700 μm devices were best suited for the TWDM standard, due to the lowest exhibited frequency drift (2.5 GHz) within the time-frame of interest. Several schemes for compensating thermal wavelength drift have been proposed in literature, while some were not feasible to test, such as using external heaters, which our devices did not contain, others were tested on our devices. It was found that a sub-threshold heating approach yielded a 6 GHz improvement in overall wavelength drift, across all pulse amplitudes, and as a consequence of some of these tests, a new pulse shaping method was developed. This new pulse-shaping method reduces the settling time of the optical frequency, in some cases by a factor of 3. Then, as the frequency change was expected to be due to thermal effects, we employed transient thermal imaging to get a better understanding of the lasers thermal performance. Our results seem to be relatively inline with wavelength based measurements, further solidifying that a thermal based theory for these devices operation is correct.en
dc.language.isoenen
dc.publisherTrinity College Dublin. School of Physics. Discipline of Physicsen
dc.rightsYen
dc.subjectlasersen
dc.subjectathermalisationen
dc.subjectTWDMen
dc.subjectoptical networksen
dc.subjectoptical communicationsen
dc.subjectburst modeen
dc.subjectpulsed modeen
dc.subjectsemiconductorsen
dc.titleAthermalisation and Characterisation of High-OrderSurface Grating Lasers for Optical Communicationsen
dc.typeThesisen
dc.type.supercollectionthesis_dissertationsen
dc.type.supercollectionrefereed_publicationsen
dc.type.qualificationlevelDoctoralen
dc.identifier.peoplefinderurlhttps://tcdlocalportal.tcd.ie/pls/EnterApex/f?p=800:71:0::::P71_USERNAME:MICKUSDen
dc.identifier.rssinternalid256641en
dc.rights.ecaccessrightsopenAccess
dc.contributor.sponsorScience Foundation Irelanden
dc.identifier.urihttp://hdl.handle.net/2262/102976


Files in this item

Thumbnail
Thumbnail

This item appears in the following Collection(s)

Show simple item record