Now showing items 1-2 of 2

    • New Technologies for Ultra-low Dose-rate Imaging in the STEM 

      Mullarkey, Tiarnan (Trinity College Dublin. School of Physics. Discipline of Physics, 2023)
      Electron microscopy arose from the need to image materials beyond the resolution optical microscopes could achieve. Though taking many years and technological advancements, the modern scanning transmission electron microscope ...
    • Using Your Beam Efficiently: Reducing Electron Dose in the STEM via Flyback Compensation 

      Jones, Lewys; Mullarkey, Tiarnan; Peters, Jonathan J. P.; Downing, Clive (2022)
      In the scanning transmission electron microscope, fast-scanning and frame-averaging are two widely used approaches for reducing electron-beam damage and increasing image signal noise ratio which require no additional ...