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dc.contributor.authorDonegan, Johnen
dc.contributor.authorBradley, Louiseen
dc.date.accessioned2008-06-05T12:10:26Z
dc.date.available2008-06-05T12:10:26Z
dc.date.issued2006en
dc.date.submitted2006en
dc.identifier.citationMaguire, P.J.; Barry, L.P.; Krug, T.; Guo, W.H.; O'Dowd, J.; Lynch, M.; Bradley, A.L.; Donegan, J.F.; Folliot, H., Optical signal processing via two-photon absorption in a semiconductor microcavity for the next generation of high-speed optical communications network, Journal of Lightwave Technology, 24, 7, 2006, 2683 - 2692en
dc.identifier.otherYen
dc.descriptionPUBLISHEDen
dc.description.abstractDue to the introduction of new broadband services, individual line data rates are expected to exceed 100 Gb/s in the near future. To operate at these high speeds, new optical signal processing techniques will have to be developed. This paper will demonstrate that two-photon absorption in a specially designed semiconductor microcavity is an ideal candidate for optical signal processing applications such as autocorrelation, sampling, and demultiplexing in high-speed wavelength-divisionmultiplexed (WDM) and hybrid WDM/optical time-divisionmultiplexed networks.en
dc.format.extent2683en
dc.format.extent2692en
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.relation.ispartofseriesJournal of Lightwave Technologyen
dc.relation.ispartofseries24en
dc.relation.ispartofseries7en
dc.rightsYen
dc.subjectsemiconductoren
dc.subjectoptical signal processingen
dc.titleOptical signal processing via two-photon absorption in a semiconductor microcavity for the next generation of high-speed optical communications networken
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jdoneganen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/bradlelen
dc.identifier.rssinternalid39985en
dc.identifier.doihttp://dx.doi.org/10.1109/JLT.2006.875202en
dc.identifier.rssurihttp://www.ir.dcu.ie/166/01/IEEE_jour_lightwave_tech_jul_2006.pdfen
dc.identifier.orcid_id0000-0002-5240-1434en
dc.identifier.urihttp://hdl.handle.net/2262/16880


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