Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier
Citation:
F. Surre, B. Kennedy, P. Landais, S. Philippe, A.L. Bradley, Polarization resolved four-wave-mixing-based measurement in bulk material semiconductor optical amplifier, International Conference on Transparent Optical Networks, 18-22 June 2006, 2, 2006, 169-172Download Item:
Abstract:
The anticipated growth in demand for bandwidth leads to the development of all-optical signal processing techniques at ever increasing data rates. One possible candidate to achieve the required performance is the semiconductor optical amplifier (SOA). It has been demonstrated that ultra-fast gain processes are dominant for pulsewidths below 10 ps. In this paper we present experimental results on the polarization dependence of ultra-fast gain dynamics in InGaAsP/InP bulk material SOA probed using a four-wave mixing technique. Using a standard low-pass filter model it is possible to retrieve information on the polarization dependence of linewidth enhancement factors and the timescales for non-linear phenomena such as carrier density pulsation and carrier heating
Author's Homepage:
http://people.tcd.ie/bradlelDescription:
PUBLISHEDINVITED
Author: Bradley, Louise
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International Conference on Transparent Optical NetworksType of material:
Conference PaperCollections
Series/Report no:
2Availability:
Full text availableKeywords:
semiconductor, SOADOI:
http://dx.doi.org/10.1109/ICTON.2006.248365Metadata
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