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Automatic location of IC design errors using an e-beam system

dc.contributor.authorBOLAND, FRANCIS MORGAN
dc.date.accessioned2008-07-28T23:12:52Z
dc.date.available2008-07-28T23:12:52Z
dc.date.created09/12/1988 - 09/14/1en
dc.date.issued1988
dc.date.submitted1988en
dc.identifier.citationMelgara, M., Battu, M., Garino, P., Dowe, J., Vernay, Y.J., Marzouki, M., Boland, F., Automatic location of IC design errors using an e-beam system, [in] digest of papers - International Test Conference , Washington, DC, : IEEE, 1988, pp898-907en
dc.identifier.otherY
dc.identifier.other51289
dc.identifier.otherYen
dc.descriptionPUBLISHEDen
dc.description.abstractThe ADVICE system discussed is an enhanced CAD (computer-aided design) linked E-beam tester to locate automatically design errors on custom VLSI devices. The goal is met by building a set of procedures to drive the interactive electron-beam debugging (EBD) system according to the strategies devised by the algorithms based on fault dictionary/hierarchical probing algorithm mixed searchen
dc.format.extent898-907en
dc.format.extent775217 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherIEEEen
dc.rightsYen
dc.subjectE-beam testeren
dc.subjectADVICE systemen
dc.subjectVLSI devicesen
dc.titleAutomatic location of IC design errors using an e-beam systemen
dc.title.alternativeInternational Test Conference: 1988en
dc.typeConference Paperen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/fboland
dc.identifier.rssinternalid51289
dc.identifier.rssurihttp://ieeexplore.ieee.org/iel2/213/5318/00207878.pdf?tp=&isnumber=&arnumber=207878
dc.identifier.urihttp://hdl.handle.net/2262/19679


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