Browsing Physics (Scholarly Publications) by Sponsor "EPSRC"
Now showing items 1-2 of 2
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A comparison of He and Ne FIB imaging of cracks in microindented silicon nitride
(2018)Helium ion microscopy (HIM) offers potential as a high spatial resolution technique for imaging insulating samples that are susceptible to charging artifacts. In this study helium and neon ion microscopy are used to image ... -
Electronic Polarizability as the Fundamental Variable in the Dielectric Properties of Two-Dimensional Materials
(2020)The dielectric constant, which defines the polarization of the media, is a key quantity in condensed matter. It determines several electronic and optoelectronic properties important for a plethora of modern technologies ...
