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dc.contributor.authorMELNIKOV, VASILY
dc.date.accessioned2008-11-24T14:33:17Z
dc.date.available2008-11-24T14:33:17Z
dc.date.issued2006
dc.date.submitted2006en
dc.identifier.citationL.A. Golovan, D.A. Ivanov, V.A. Melnikov, V.Yu. Timoshenko, A.M. Zheltikov, P.K. Kashkarov, G.I. Petrov, V.V. Yakovlev `Form birefringence of oxidized porous silicon? in Applied Physics Letters, 88, 2006, pp 241113/1 - 241113/3en
dc.identifier.issn0003-6951
dc.identifier.otherYen
dc.descriptionPUBLISHEDen
dc.description.abstractA network of preferentially oriented pores is shown to induce anisotropy of linear and nonlinear optical properties of oxidized porous silicon (OPS) films. Although the x-ray diffraction indicates the presence of amorphous phase in OPS samples, the near-infrared and visible transmission measurements reveal a strong in-plane anisotropy exceeding that for the crystalline quartz. This anisotropy modifies dramatically polarization properties of the nonlinear optical properties resulting in a strong anisotropy of the third-harmonic signal generated from these filmsen
dc.format.extent241113/1en
dc.format.extent241113/3en
dc.format.extent117821 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherAmerican Institute of Physicsen
dc.relation.ispartofseriesApplied Physics Lettersen
dc.relation.ispartofseries88en
dc.rightsYen
dc.subjectElectronic & Electrical Engineeringen
dc.titleForm birefringence of oxidized porous siliconen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/melnikov
dc.identifier.rssinternalid43462
dc.identifier.rssurihttp://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=APPLAB000088000024241113000001&idtype=cvips
dc.identifier.urihttp://hdl.handle.net/2262/24980


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