The spatial uniformity and electromechanical stability of transparent, conductive films of single walled nanotubes

Abstract

We have prepared thin films of arc discharge single walled nanotubes by vacuum filtration. For film thicknesses greater than 40 nm, the films are of high optical quality; the optical transmission varies by <2% over the film area when measured with a spatial resolution of 4 ?m. However, the films become spatially non-uniform for film thickness below 40 nm. The in-plane DC conductivity correlates with the uniformity, increasing from 3800 S/m for a 10 nm thick film to 2?2.5 ? 105 S/m for films of thickness >40 nm. Conductive atomic force microscopy maps show reasonably uniform current flow out of the plane of the film. For all thicknesses, the optical transmittance scales with film thickness as expected for a thin conducting film with optical conductivity of 1.7 ? 104 S/m (? = 550 nm). For films with t > 40 nm the ratio of DC to optical conductivity was ?DC/?Op = 13.0, leading to values of transmittance and sheet resistance such as T = 80% and Rs = 110 ?/? for the t = 40 nm film. Electromechanically, these films were very stable showing conductivity changes of <5% and <2% when cycled over 2000 times in compression and tension respectively.