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dc.contributor.authorWILSON, SIMON PAUL
dc.date.accessioned2009-09-18T16:07:39Z
dc.date.available2009-09-18T16:07:39Z
dc.date.created6-10 May 2007en
dc.date.issued2007
dc.date.submitted2007en
dc.identifier.citationWilson, S., Flood, B., Goyal, S., Mosher, J., Bergin, S., O'Brien, J., Kennedy, R. `Parameter estimation for a model with both imperfect test and repair? in Proceedings of the IEEE VLSI Test Symposium, Berkeley, CA, 6-10 May 2007, IEEE, 2007, pp 271-276en
dc.identifier.otherY
dc.identifier.otherYen
dc.descriptionPUBLISHEDen
dc.description.abstractWe describe estimation of the parameters of a manufacturing test and repair model using data available from that test. The model allows imperfect testing and imperfect repair. The principal problem that we address is of parameter identification, given insufficient data, that we address by making conservative assumptions on the property being measured and the associated parameter values. Several cases of commonly occurring test types, in the manufacture of electronic products, are considered.en
dc.description.sponsorshipThe involvement of BLI researchers is supported by a grant from the Industrial Development Agency of Ireland. The involvement of CTVR researchers is supported by Science Foundation Ireland grant 03/CE3/I405.en
dc.format.extent271-276en
dc.format.extent250284 bytes
dc.format.mimetypeapplication/pdf
dc.language.isoenen
dc.publisherIEEEen
dc.rightsYen
dc.subjectStatisticsen
dc.titleParameter estimation for a model with both imperfect test and repairen
dc.typeConference Paperen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/swilson
dc.contributor.sponsorScience Foundation Ireland
dc.identifier.urihttp://hdl.handle.net/2262/32968


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