dc.contributor.author | WILSON, SIMON PAUL | |
dc.date.accessioned | 2009-09-18T16:07:39Z | |
dc.date.available | 2009-09-18T16:07:39Z | |
dc.date.created | 6-10 May 2007 | en |
dc.date.issued | 2007 | |
dc.date.submitted | 2007 | en |
dc.identifier.citation | Wilson, S., Flood, B., Goyal, S., Mosher, J., Bergin, S., O'Brien, J., Kennedy, R. `Parameter estimation for a model with both imperfect test and repair? in Proceedings of the IEEE VLSI Test Symposium, Berkeley, CA, 6-10 May 2007, IEEE, 2007, pp 271-276 | en |
dc.identifier.other | Y | |
dc.identifier.other | Y | en |
dc.description | PUBLISHED | en |
dc.description.abstract | We describe estimation of the parameters of a
manufacturing test and repair model using data available
from that test. The model allows imperfect testing and
imperfect repair. The principal problem that we address
is of parameter identification, given insufficient data, that
we address by making conservative assumptions on the
property being measured and the associated parameter
values. Several cases of commonly occurring test types, in
the manufacture of electronic products, are considered. | en |
dc.description.sponsorship | The involvement of BLI researchers is supported by a
grant from the Industrial Development Agency of Ireland.
The involvement of CTVR researchers is supported by
Science Foundation Ireland grant 03/CE3/I405. | en |
dc.format.extent | 271-276 | en |
dc.format.extent | 250284 bytes | |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.publisher | IEEE | en |
dc.rights | Y | en |
dc.subject | Statistics | en |
dc.title | Parameter estimation for a model with both imperfect test and repair | en |
dc.type | Conference Paper | en |
dc.type.supercollection | scholarly_publications | en |
dc.type.supercollection | refereed_publications | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/swilson | |
dc.contributor.sponsor | Science Foundation Ireland | |
dc.identifier.uri | http://hdl.handle.net/2262/32968 | |