dc.contributor.author | Bradley, Louise | en |
dc.date.accessioned | 2009-09-22T09:07:10Z | |
dc.date.available | 2009-09-22T09:07:10Z | |
dc.date.issued | 2008 | en |
dc.date.submitted | 2008 | en |
dc.identifier.citation | J. O' Dowd, W. H. Guo, E. Flood, M. Lynch, A. L. Bradley, L. P. Barry, and J. F. Donegan, Polarization dependence of a GaAs-based two-photon absorption microcavity photodetector, Optics Express, 16, 22, 2008, 17682-17688 | en |
dc.identifier.other | Y | en |
dc.description | PUBLISHED | en |
dc.description.abstract | In this paper, the polarization response of a GaAs based twophoton
absorption microcavity photodetector has been studied. The
deviation in the dependence of the detector response from that of bulk GaAs
is shown to be due to the birefringence of the cavity. A theoretical model
based on the convolution of the cavity birefringence and the polarization
dependence of two-photon absorption in GaAs is described and shown to
match the measured polarization dependence of the microcavity detector
very well. | en |
dc.description.sponsorship | The authors would like to thank Dan Kilper of Bell Laboratories, Crawford Hill, for helpful
discussions. This work was supported by SFI under its CSET Centre for Telecommunication
Value Driven Research (CTVR), Grant 03/CE3/I404 and by an SFI frontiers grant
RFP/2006/ENE012 | en |
dc.format.extent | 17682-17688 | en |
dc.format.mimetype | application/pdf | |
dc.language.iso | en | en |
dc.relation.ispartofseries | Optics Express | en |
dc.relation.ispartofseries | 16 | en |
dc.relation.ispartofseries | 22 | en |
dc.rights | Y | en |
dc.subject | Physics | en |
dc.title | Polarization dependence of a GaAs-based two-photon absorption microcavity photodetector | en |
dc.type | Journal Article | en |
dc.type.supercollection | scholarly_publications | en |
dc.type.supercollection | refereed_publications | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/bradlel | en |
dc.identifier.rssinternalid | 56752 | en |
dc.identifier.doi | https://doi.org/10.1364/OE.16.017682 | en |
dc.subject.TCDTheme | Nanoscience & Materials | en |
dc.identifier.rssuri | http://dx.doi.org/10.1364/OE.16.017682 | |
dc.identifier.orcid_id | 0000-0002-9399-8628 | en |
dc.identifier.uri | http://hdl.handle.net/2262/33046 | |