| dc.contributor.author | MOORE, ALAN | en |
| dc.contributor.author | PEROVA, TANIA | en |
| dc.date.accessioned | 2010-02-01T12:51:12Z | |
| dc.date.available | 2010-02-01T12:51:12Z | |
| dc.date.created | 16-19 May | en |
| dc.date.issued | 2004 | en |
| dc.date.submitted | 2004 | en |
| dc.identifier.citation | S. Das, S. Chakraborty, S. Bhattacharya, M. Bain, J. McCarthy, B.M. Armstrong, H.S. Gamble, G.K. Dalapati, S.K. Samanta, T. Perova, R.A. Moore and C.K. Maiti, Rapid Thermal Oxidation of Strained-Ge Layers, IEEE 24th International Conference on Microelectronics (MIEL-2004), NIS, Serbia and Montenegro, 16-19 May, 24, 2, 2004, 479, 482 | en |
| dc.identifier.other | Y | en |
| dc.description | PRESENTED | en |
| dc.description | NIS, Serbia and Montenegro | en |
| dc.description | Oral Presentation. | en |
| dc.format.extent | 479 | en |
| dc.format.extent | 482 | en |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.relation.ispartofseries | 24 | en |
| dc.relation.ispartofseries | 2 | en |
| dc.rights | Y | en |
| dc.subject | Electronic & Electrical Engineering | |
| dc.title | Rapid Thermal Oxidation of Strained-Ge Layers | en |
| dc.title.alternative | IEEE 24th International Conference on Microelectronics (MIEL-2004) | en |
| dc.type | Conference Paper | en |
| dc.type.supercollection | scholarly_publications | en |
| dc.type.supercollection | refereed_publications | en |
| dc.identifier.peoplefinderurl | http://people.tcd.ie/rmoore | en |
| dc.identifier.peoplefinderurl | http://people.tcd.ie/perovat | en |
| dc.identifier.rssinternalid | 14138 | en |
| dc.identifier.rssuri | http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=01314867 | en |
| dc.identifier.uri | http://hdl.handle.net/2262/36649 | |
