| dc.contributor.author | HEGARTY, JOHN | |
| dc.date.accessioned | 2010-02-16T14:53:10Z | |
| dc.date.available | 2010-02-16T14:53:10Z | |
| dc.date.issued | 2002 | |
| dc.date.submitted | 2002 | en |
| dc.identifier.citation | Dunbar LA, Stanley RP, Lynch M, Hegarty J, Oesterle U, Houdre R, Ilegems M, Excitation-induced coherence in a semiconductor microcavity, Physical Review B, 66, (19), 2002, p195307-1 - 195307-5 | en |
| dc.identifier.other | Y | |
| dc.description | PUBLISHED | en |
| dc.description.abstract | We measure the dephasing times of high finesse semiconductor microcavities in the strong coupling regime using degenerate four-wave mixing. We find that under certain excitation conditions (near-normal incidence) the dephasing time of the lower polariton branch increases with the excitation intensity. This excitation induced coherence indicates that the lower polariton is acting as a Bose particle. | en |
| dc.format.extent | 195307-1 | en |
| dc.format.extent | 195307-5 | en |
| dc.format.extent | 64889 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.language.iso | en | en |
| dc.publisher | American Physical Society | en |
| dc.relation.ispartofseries | Physical Review B | en |
| dc.relation.ispartofseries | 66 | en |
| dc.relation.ispartofseries | 19 | en |
| dc.rights | Y | en |
| dc.subject | Physics | |
| dc.title | Excitation-induced coherence in a semiconductor microcavity | en |
| dc.type | Journal Article | en |
| dc.type.supercollection | scholarly_publications | en |
| dc.type.supercollection | refereed_publications | en |
| dc.identifier.peoplefinderurl | http://people.tcd.ie/jhegarty | |
| dc.identifier.rssinternalid | 29093 | |
| dc.identifier.rssuri | http://dx.doi.org/10.1103/PhysRevB.66.195307 | en |
| dc.contributor.sponsor | Enterprise Ireland | en |
| dc.identifier.uri | http://hdl.handle.net/2262/38040 | |
