Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light
Citation:
Durkan, C., Shvets, I.V., Reflection-mode scanning near-field optical microscopy: Influence of sample type, tip shape, and polarization of light , Journal of Applied Physics, 83, 3, 1998, 1171-1176Download Item:
Abstract:
A reflection-mode aperture-type scanning near-field optical microscope (R-SNOM) based on the external collection of the reflected light is presented. The light detection is based on an elliptical mirror setup, with the tip and sample at one focus, and a photomultiplier tube at the other. Results are presented on the general imaging properties of this microscope. The results presented concentrate on an analysis of the gap-width dependence of the optical signal, on resolution and on the contrast mechanisms which may be used in R-SNOM imaging, including reflectivity, polarization/magneto-optics, and topographic effects.
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European Union (EU)
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http://people.tcd.ie/ivchvetsDescription:
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Author: SHVETS, IGOR
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European Union (EU)Publisher:
American Institute of PhysicsType of material:
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Journal of Applied Physics;83;
3;
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