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dc.contributor.authorBradley, Louiseen
dc.date.accessioned2011-09-06T15:47:30Z
dc.date.available2011-09-06T15:47:30Z
dc.date.issued2011en
dc.date.submitted2011en
dc.identifier.citationRobert Lennox, Kevin Carney, Ram?n Maldonado-Basilio, Severine Philippe, A. Louise Bradley, and Pascal Landais, Impact of bias current distribution on the noise figure and power saturation of a multicontact semiconductor optical amplifier, Optics Letters, 36, 13, 2011, 2521-2523en
dc.identifier.otherYen
dc.descriptionPUBLISHEDen
dc.description.abstractWe present an experimental investigation of a multicontact semiconductor optical amplifier. This first-generation device allows for direct control of the carrier density profile along the length of the waveguide. This is used to control the device noise figure, with a minimum value of 5 dB observed at a gain of 15 dB for an optimum carrier density profile. The opposite carrier density profile results in an increase of the power saturation by 3 dB.en
dc.description.sponsorshipThe authors acknowledge Enterprise Ireland for their support under grant CFTD/06/IT/332 and the Higher Education Authority Programme for Research in Third Level Institutions (2007-2011) via the INSPIRE programme. S. Philippe acknowledges the Irish Research Council for Science, Engineering and Technology for their support.en
dc.format.extent2521-2523en
dc.language.isoenen
dc.relation.ispartofseriesOptics Lettersen
dc.relation.ispartofseries36en
dc.relation.ispartofseries13en
dc.rightsYen
dc.subjectOpticsen
dc.subjectNETWORKSen
dc.subjectDEVICESen
dc.titleImpact of bias current distribution on the noise figure and power saturation of a multicontact semiconductor optical amplifieren
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/bradlelen
dc.identifier.rssinternalid74851en
dc.identifier.doihttps://doi.org/10.1364/OL.36.002521en
dc.subject.TCDThemeNanoscience & Materialsen
dc.identifier.rssurihttp://dx.doi.org/10.1364/OL.36.002521en
dc.identifier.orcid_id0000-0002-9399-8628en
dc.contributor.sponsorEnterprise Irelanden
dc.contributor.sponsorGrantNumberCFTD/06/IT/332en
dc.contributor.sponsorHigher Education Authority (HEA)en
dc.contributor.sponsorIrish Research Council for Science and Engineering Technology (IRCSET)en
dc.identifier.urihttp://hdl.handle.net/2262/59312


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