| dc.contributor.author | O'KELLY, KEVIN | en |
| dc.date.accessioned | 2012-03-01T12:02:21Z | |
| dc.date.available | 2012-03-01T12:02:21Z | |
| dc.date.issued | 2011 | en |
| dc.date.submitted | 2011 | en |
| dc.identifier.citation | N. Payraudeau, D. McGrouther and K.U. O'Kelly, Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography, Microscopy and Microanalysis, 17, 2011, 240-245 | en |
| dc.identifier.other | Y | en |
| dc.description | PUBLISHED | en |
| dc.description.abstract | In this study, we present a fully automated method to investigate and reconstruct the three-dimensional crack structure beneath an indent in a highly insulating material. This work concentrates on issues arising from a long automatic acquisition process, the insulating nature of the specimen, and the introduction of minimal damage to the original cracks resulting from indentation. | en |
| dc.format.extent | 240-245 | en |
| dc.language.iso | en | en |
| dc.relation.ispartofseries | Microscopy and Microanalysis | en |
| dc.relation.ispartofseries | 17 | en |
| dc.rights | Y | en |
| dc.subject | Materials Science | en |
| dc.subject | focused ion beam (FIB) microscopy | en |
| dc.title | Quantification of Subsurface Damage in a Brittle Insulating Ceramic by Three-Dimensional Focused Ion Beam Tomography | en |
| dc.type | Journal Article | en |
| dc.type.supercollection | scholarly_publications | en |
| dc.type.supercollection | refereed_publications | en |
| dc.identifier.peoplefinderurl | http://people.tcd.ie/okellyk | en |
| dc.identifier.rssinternalid | 78519 | en |
| dc.subject.TCDTheme | Nanoscience & Materials | en |
| dc.identifier.rssuri | http://dx.doi.org/10.1017/S1431927610094523 | en |
| dc.contributor.sponsor | European Commission | en |
| dc.contributor.sponsorGrantNumber | 026019 | en |
| dc.contributor.sponsor | Science Foundation Ireland (SFI) | en |
| dc.identifier.uri | http://hdl.handle.net/2262/62459 | |
