Strain induced exciton fine-structure splitting and shift in bent ZnO microwires
![Thumbnail](/themes/edepositireland/images/white_rectangle.jpeg)
File Type:
PDFItem Type:
Journal ArticleDate:
2012Access:
OpenAccessCitation:
Liao, Z.-M., Wu, H.-C., Fu, Q., Fu, X., Zhu, X., Xu, J., Shvets, I.V., (...), Yu, D.-P., Strain induced exciton fine-structure splitting and shift in bent ZnO microwires, Scientific Reports, 2, 2012, art. no. 452Download Item:
Abstract:
Lattice strain is a useful and economic way to tune the device performance and is commonly present in
nanostructures. Here, we investigated for the first time the exciton spectra evolution in bent ZnO
microwires along the radial direction via high spatial/energy resolution cathodeluminescence spectroscopy
at 5.5 K. Our experiments show that the exciton peak splits into multi fine peaks towards the compressive
part while retains one peak in the tensile part and the emission peak displays a continuous blue-shift from
tensile to compressive edges. In combination with first-principles calculations, we show that the observed
NBE emission splitting is due to the valence band splitting and the absence of peak splitting in the tensile
part maybe due to the highly localized holes in the A band and the carrier density distribution across the
microwire. Our studies may pave the way to design nanophotonic and electronic devices using bent ZnO
nanowires.
Author's Homepage:
http://people.tcd.ie/ivchvetshttp://people.tcd.ie/wuh2
Description:
PUBLISHED
Author: SHVETS, IGOR; WU, HAN-CHUN
Type of material:
Journal ArticleCollections
Series/Report no:
Scientific Reports;2;
Availability:
Full text availableMetadata
Show full item recordLicences: