Browsing Electronic & Electrical Eng by Subject "Mechanical & Manufacturing Engineering"
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Polarized Raman Spectroscopy of Multilayer Ge/Si(001) Quantum Dot Heterostructures.
(American Institute of Physics, 2004)Polarized Raman spectroscopy in backscattering geometry has been applied here for the investigation of Ge/Si(001) quantum dot multilayer structures (with the number of layers ranging from 1 to 21) grown by the Stranski-Krastanov ...