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dc.contributor.advisorPethica, J.B.
dc.contributor.authorO'Brien, Simon Joseph
dc.date.accessioned2019-05-01T14:33:19Z
dc.date.available2019-05-01T14:33:19Z
dc.date.issued2008
dc.identifier.citationSimon Joseph O'Brien, 'A novel scanning probe micoscopy study of the (110) surface of rutile titanium dioxide', [thesis], Trinity College (Dublin, Ireland). School of Physics, 2008, pp 161
dc.identifier.otherTHESIS 8609
dc.description.abstractThis work describes the application of a novel multi-parameter scanning probe technique to the study of a model semiconductor and a metal oxide surface. Our novel scanning probe technique enables the simultaneous measurement of tunneling current, force gradient, barrier height and dissipation through the use of sub-Angstrom oscillation amplitudes.
dc.format1 volume
dc.language.isoen
dc.publisherTrinity College (Dublin, Ireland). School of Physics
dc.relation.isversionofhttp://stella.catalogue.tcd.ie/iii/encore/record/C__Rb13547420
dc.subjectPhysics, Ph.D.
dc.subjectPh.D. Trinity College Dublin
dc.titleA novel scanning probe micoscopy study of the (110) surface of rutile titanium dioxide
dc.typethesis
dc.type.supercollectionthesis_dissertations
dc.type.supercollectionrefereed_publications
dc.type.qualificationlevelDoctoral
dc.type.qualificationnameDoctor of Philosophy (Ph.D.)
dc.rights.ecaccessrightsopenAccess
dc.format.extentpaginationpp 161
dc.description.noteTARA (Trinity's Access to Research Archive) has a robust takedown policy. Please contact us if you have any concerns: rssadmin@tcd.ie
dc.identifier.urihttp://hdl.handle.net/2262/86552


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