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dc.contributor.advisorPerova, Tatiana
dc.contributor.authorDyakov, Sergey
dc.date.accessioned2019-11-05T16:50:53Z
dc.date.available2019-11-05T16:50:53Z
dc.date.issued2012
dc.identifier.citationSergey Dyakov, 'Application of matrix methods for investigation of silicon based layered structures', [thesis], Trinity College (Dublin, Ireland). Department of Electronic & Electrical Engineering, 2012, pp 200
dc.identifier.otherTHESIS 9809
dc.description.abstractThis work is dedicated to the theoretical and experimental investigation of the influence of nano- and microstructuring of silicon systems on their linear optical response. The wavelengths of the light are comparable to the typical size of the investigated structures. For calculation of passive and active optical characteristics in the considered spectral range, the transfer and the scattering matrix methods are used.
dc.format1 volume
dc.language.isoen
dc.publisherTrinity College (Dublin, Ireland). Department of Electronic & Electrical Engineering
dc.relation.isversionofhttp://stella.catalogue.tcd.ie/iii/encore/record/C__Rb15318859
dc.subjectElectronic & Electrical Engineering, Ph.D.
dc.subjectPh.D. Trinity College Dublin.
dc.titleApplication of matrix methods for investigation of silicon based layered structures
dc.typethesis
dc.type.supercollectionthesis_dissertations
dc.type.supercollectionrefereed_publications
dc.type.qualificationlevelDoctoral
dc.type.qualificationnameDoctor of Philosophy (Ph.D.)
dc.rights.ecaccessrightsopenAccess
dc.format.extentpaginationpp 200
dc.description.noteTARA (Trinity’s Access to Research Archive) has a robust takedown policy. Please contact us if you have any concerns: rssadmin@tcd.ie
dc.identifier.urihttp://hdl.handle.net/2262/90117


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