dc.contributor.author | Shvets, Igor | |
dc.contributor.author | KAISHA, AITKAZY | |
dc.contributor.author | ZHUSSUPBEKOVA, AINUR | |
dc.contributor.author | AINABAYEV, ARDAK | |
dc.contributor.author | Caffrey, David | |
dc.date.accessioned | 2020-03-21T06:25:30Z | |
dc.date.available | 2020-03-21T06:25:30Z | |
dc.date.issued | 2020 | en |
dc.date.submitted | 2020 | en |
dc.identifier.citation | Igor Shvets, AITKAZY KAISHA, AINUR ZHUSSUPBEKOVA, ARDAK AINABAYEV, David Caffrey, 'Crystallographic Characterisation of Ultra-Thin, or Amorphous Transparent Conducting Oxides ? The Case for Raman Spectroscopy', 2020, Materials;, 13;, 267; | en |
dc.identifier.other | Y | |
dc.description | PUBLISHED | en |
dc.description.abstract | The electronic and optical properties of transparent conducting oxides (TCOs) are closely linked to their crystallographic structure on a macroscopic (grain sizes) and microscopic (bond structure) level. With the increasing drive towards using reduced film thicknesses in devices and growing interest in amorphous TCOs such as n-type InGaZnO4 (IGZO), ZnSnO3 (ZTO), p-type CuxCrO2, or ZnRh2O4, the task of gaining in-depth knowledge on their crystal structure by conventional X-ray diffraction-based measurements are becoming increasingly difficult. We demonstrate the use of a focal shift based background subtraction technique for Raman spectroscopy specifically developed for the case of transparent thin films on amorphous substrates. Using this technique we demonstrate, for a variety of TCOs CuO, a-ZTO, ZnO:Al), how changes in local vibrational modes reflect changes in the composition of the TCO and consequently their electronic properties. | en |
dc.description.sponsorship | This research was funded by Science Foundation Ireland under grant number 12/IA/1264, and SFI/12/RC/2278, and the Ministry of Education and Science of the Republic of Kazakhstan under grant number AP05134861 and 0115PK03029. | en |
dc.format.extent | 1-14 | en |
dc.language.iso | en | en |
dc.relation.ispartofseries | Materials; | |
dc.relation.ispartofseries | 13; | |
dc.relation.ispartofseries | 267; | |
dc.rights | Y | en |
dc.subject | transparent conducting oxide | en |
dc.subject | TCO | en |
dc.subject | Raman spectroscopy | en |
dc.subject | amorphous oxide | en |
dc.subject | oxide electronics | en |
dc.subject | background subtraction | en |
dc.title | Crystallographic Characterisation of Ultra-Thin, or Amorphous Transparent Conducting Oxides ? The Case for Raman Spectroscopy | en |
dc.type | Journal Article | en |
dc.type.supercollection | scholarly_publications | en |
dc.type.supercollection | refereed_publications | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/caffreda | |
dc.identifier.peoplefinderurl | http://people.tcd.ie/ivchvets | |
dc.identifier.peoplefinderurl | http://people.tcd.ie/ainabaya | |
dc.identifier.peoplefinderurl | http://people.tcd.ie/zhussupa | |
dc.identifier.peoplefinderurl | http://people.tcd.ie/kaishaa | |
dc.identifier.rssinternalid | 215020 | |
dc.identifier.doi | https://doi.org/10.3390/ma13020267 | |
dc.rights.ecaccessrights | openAccess | |
dc.contributor.sponsor | Science Foundation Ireland | en |
dc.contributor.sponsorGrantNumber | 12/IA/1264 | en |
dc.contributor.sponsor | Science Foundation Ireland | en |
dc.contributor.sponsorGrantNumber | SFI/12/RC/2278 | en |
dc.contributor.sponsor | Ministry of Education and Science, Republic of Kazakhstan | en |
dc.contributor.sponsorGrantNumber | AP05134861 | en |
dc.contributor.sponsor | Ministry of Education and Science, Republic of Kazakhstan | en |
dc.contributor.sponsorGrantNumber | 0115PK03029 | en |
dc.identifier.uri | http://hdl.handle.net/2262/91843 | |