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dc.contributor.authorBradley, Louise
dc.date.accessioned2020-07-30T12:43:54Z
dc.date.available2020-07-30T12:43:54Z
dc.date.issued2007
dc.date.submitted2007en
dc.identifier.citationO'Reilly, L., Mitra, A., Lucas, O.F., Natarajan, G., McNally, P.J., Daniels, S., Lankinen, A., Lowney, D., Bradley, A.L., Cameron, D.C., Characterisation of n-type γ-CuCl on Si for UV optoelectronic applications, Journal of Materials Science: Materials in Electronics, 2007, 18, 1, S57 - S60en
dc.identifier.otherY
dc.descriptionPUBLISHEDen
dc.description.abstractThe use of co-evaporation of ZnCl2 with CuCl in order to achieve n-type conductivity in CuCl is reported herein. Linear current–voltage (IV) characteristics in the range of ±4 V have been measured using Cu–Au electrical contacts. Room temperature Hall effect measurements show some evidence of a mixed conduction mechanism. On average the samples exhibit n-type conductivity with a bulk electron carrier concentration n ∼1 × 1016 cm−3 and Hall mobility μ ∼ 29 cm2v−1s−1 for a CuCl sample doped with a nominal 3 mole % ZnCl2. By use of an in situ CaF2 capping layer, transmission >90% is achieved. At room temperature a strong Z3 free excitonic emission occurs at ∼385 nm using both photoluminescence and x-ray excited optical luminescence, indicating the high optical quality of the doped material.en
dc.format.extentS57en
dc.format.extentS60en
dc.language.isoenen
dc.relation.ispartofseriesJournal of Materials Science: Materials in Electronics;
dc.relation.ispartofseries18;
dc.relation.ispartofseries1;
dc.rightsYen
dc.subjectOptoelectronicsen
dc.subjectSemiconductorsen
dc.titleCharacterisation of n-type γ-CuCl on Si for UV optoelectronic applicationsen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/bradlel
dc.identifier.rssinternalid49457
dc.identifier.doihttp://dx.doi.org/10.1007/s10854-007-9173-0
dc.rights.ecaccessrightsopenAccess
dc.identifier.orcid_id0000-0002-9399-8628
dc.identifier.urihttp://hdl.handle.net/2262/93085


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