dc.contributor.author | Bradley, Louise | |
dc.date.accessioned | 2020-07-30T16:11:59Z | |
dc.date.available | 2020-07-30T16:11:59Z | |
dc.date.issued | 2006 | |
dc.date.submitted | 2006 | en |
dc.identifier.citation | O'Reilly, L., Natarajan, G., Lucas, O.F., McNally, P.J., Daniels, S., Mitra, A., Bradley, L., Cameron, D., Reader, A., Impact on structural, optical and electrical properties of CuCl by incorporation of Zn for n-type doping, Journal of Crystal Growth, 287, 2006, 1, 139 - 144 | en |
dc.identifier.other | Y | |
dc.description | PUBLISHED | en |
dc.description.abstract | γ-CuCl is a wide-band gap (Eg = 3.395eV at 4 K) , direct band gap, semiconductor material with a cubic zincblende lattice structure. A very large exciton binding energy (190 meV), assures efficient exciton-based emission at room temperature. Its lattice constant, means that the lattice mismatch to Si (aSi=0.543 nm) is <0.5%.
γ-CuCl on Si—the growth of a wide-band gap, direct band gap, optoelectronics material on silicon substrate is a novel material system, with compatibility to current Si-based electronic/optoelectronics technologies. Both n-type and p-type CuCl will be required for development of homojunction light-emitting diodes (LEDs). The authors report on the impact of incorporation of Zn for n-type doping of CuCl by co-evaporation of CuCl and ZnCl2.
Polycrystalline Zn-doped γ-CuCl thin films are grown on Si (1 1 1), Si (1 0 0), and glass substrates by physical vapour deposition. X-ray diffraction (XRD) studies confirm that this n-doped CuCl has a cubic zincblende structure with a preferred (1 1 1) orientation. Several excitonic bands are evident in low-temperature photoluminescence (PL) measurements such as the Z3 free exciton at ∼388 nm; I1-bound exciton at ∼392 nm and M free biexciton at ∼393 nm. Cathodoluminescence (CL) and PL reveal a strong room temperature Z3 excitonic emission at ∼385 nm. Electrical measurements indicate n-type conductivity with resistivity ∼34 Ωcm. | en |
dc.format.extent | 139 | en |
dc.format.extent | 144 | en |
dc.language.iso | en | en |
dc.relation.ispartofseries | J. Cryst. Growth; | |
dc.relation.ispartofseries | 287; | |
dc.relation.ispartofseries | 1; | |
dc.rights | Y | en |
dc.subject | Doping | en |
dc.subject | X-ray diffraction | en |
dc.subject | CuCl | en |
dc.subject | Wide-band gap semiconductor | en |
dc.title | Impact on structural, optical and electrical properties of CuCl by incorporation of Zn for n-type doping | en |
dc.type | Journal Article | en |
dc.type.supercollection | scholarly_publications | en |
dc.type.supercollection | refereed_publications | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/bradlel | |
dc.identifier.rssinternalid | 39275 | |
dc.identifier.doi | http://dx.doi.org/10.1016/j.jcrysgro.2005.10.057 | |
dc.rights.ecaccessrights | openAccess | |
dc.identifier.orcid_id | 0000-0002-9399-8628 | |
dc.identifier.uri | http://hdl.handle.net/2262/93086 | |