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dc.contributor.authorZhussupbekova, Ainuren
dc.contributor.authorDuesberg, Georgen
dc.contributor.authorShvets, Igoren
dc.date.accessioned2021-01-24T22:36:12Z
dc.date.available2021-01-24T22:36:12Z
dc.date.issued2021en
dc.date.submitted2021en
dc.identifier.citationKuanysh Zhussupbekov, Lida Ansari, John B. McManus, Ainur Zhussupbekova, Igor V. Shvets, Georg S. Duesberg, Paul K. Hurley, Farzan Gity, Cormac Ó Coileáin & Niall McEvoy, Imaging and identification of point defects in PtTe2, npj 2D Materials and Applications, 5, 14, 2021en
dc.identifier.otherYen
dc.descriptionPUBLISHEDen
dc.description.abstractThe properties and performance of two-dimensional (2D) materials can be greatly affected by point defects. PtTe2, a 2D material that belongs to the group 10 transition metal dichalcogenides, is a type-II Dirac semimetal, which has gained a lot of attention recently due to its potential for applications in catalysis, photonics, and spintronics. Here, we provide an experimental and theoretical investigation of point defects on and near the surface of PtTe2. Using scanning tunneling microscopy and scanning tunneling spectroscopy (STS) measurements, in combination with first-principle calculations, we identify and characterize five common surface and subsurface point defects. The influence of these defects on the electronic structure of PtTe2 is explored in detail through grid STS measurements and complementary density functional theory calculations. We believe these findings will be of significance to future efforts to engineer point defects in PtTe2, which is an interesting and enticing approach to tune the chargecarrier mobility and electron–hole recombination rates, as well as the site reactivity for catalysis.en
dc.language.isoenen
dc.relation.ispartofseriesnpj 2D Materials and Applicationsen
dc.relation.ispartofseries5en
dc.relation.ispartofseries14en
dc.rightsYen
dc.subjectScanning tunneling microscopy, point defects, transitional metal dichalcogenidesen
dc.titleImaging and identification of point defects in PtTe2en
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/zhussupaen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/duesbergen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/ivchvetsen
dc.identifier.rssinternalid223037en
dc.identifier.doihttps://doi.org/10.1038/s41699-020-00196-8en
dc.relation.ecprojectidinfo:eu-repo/grantAgreement/EC/FP7/881603
dc.rights.ecaccessrightsopenAccess
dc.subject.TCDThemeNanoscience & Materialsen
dc.subject.TCDTagNANOSTRUCTURESen
dc.subject.TCDTagNanotechnologyen
dc.subject.TCDTagSEMICONDUCTOR DEVICES AND MATERIALSen
dc.identifier.rssurihttps://doi.org/10.1038/s41699-020-00196-8en
dc.status.accessibleNen
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.contributor.sponsorGrantNumberPI_15/IA/ 3131en
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.contributor.sponsorGrantNumberPI_12/IA/1264en
dc.contributor.sponsorIrish Research Council for Science and Engineering Technology (IRCSET)en
dc.contributor.sponsorGrantNumberIRCLA/2019/171en
dc.contributor.sponsorIrish Research Council (IRC)en
dc.contributor.sponsorGrantNumberGOIPD/2018/653en
dc.contributor.sponsorEuropean Commissionen
dc.contributor.sponsorGrantNumber881603en
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.contributor.sponsorGrantNumber2/RC/2278_P2en
dc.contributor.sponsorBMBFen
dc.contributor.sponsorGrantNumber16ES1121en
dc.contributor.sponsorScience Foundation Ireland (SFI)en
dc.contributor.sponsorGrantNumber15/SIRG/3329en
dc.identifier.urihttp://hdl.handle.net/2262/94763


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