dc.contributor.author | Zhussupbekova, Ainur | en |
dc.contributor.author | Duesberg, Georg | en |
dc.contributor.author | Shvets, Igor | en |
dc.date.accessioned | 2021-01-24T22:36:12Z | |
dc.date.available | 2021-01-24T22:36:12Z | |
dc.date.issued | 2021 | en |
dc.date.submitted | 2021 | en |
dc.identifier.citation | Kuanysh Zhussupbekov, Lida Ansari, John B. McManus, Ainur Zhussupbekova, Igor V. Shvets, Georg S. Duesberg, Paul K. Hurley, Farzan Gity, Cormac Ó Coileáin & Niall McEvoy, Imaging and identification of point defects in PtTe2, npj 2D Materials and Applications, 5, 14, 2021 | en |
dc.identifier.other | Y | en |
dc.description | PUBLISHED | en |
dc.description.abstract | The properties and performance of two-dimensional (2D) materials can be greatly affected by point defects. PtTe2, a 2D material
that belongs to the group 10 transition metal dichalcogenides, is a type-II Dirac semimetal, which has gained a lot of attention
recently due to its potential for applications in catalysis, photonics, and spintronics. Here, we provide an experimental and
theoretical investigation of point defects on and near the surface of PtTe2. Using scanning tunneling microscopy and scanning
tunneling spectroscopy (STS) measurements, in combination with first-principle calculations, we identify and characterize five
common surface and subsurface point defects. The influence of these defects on the electronic structure of PtTe2 is explored in
detail through grid STS measurements and complementary density functional theory calculations. We believe these findings will be
of significance to future efforts to engineer point defects in PtTe2, which is an interesting and enticing approach to tune the chargecarrier
mobility and electron–hole recombination rates, as well as the site reactivity for catalysis. | en |
dc.language.iso | en | en |
dc.relation.ispartofseries | npj 2D Materials and Applications | en |
dc.relation.ispartofseries | 5 | en |
dc.relation.ispartofseries | 14 | en |
dc.rights | Y | en |
dc.subject | Scanning tunneling microscopy, point defects, transitional metal dichalcogenides | en |
dc.title | Imaging and identification of point defects in PtTe2 | en |
dc.type | Journal Article | en |
dc.type.supercollection | scholarly_publications | en |
dc.type.supercollection | refereed_publications | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/zhussupa | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/duesberg | en |
dc.identifier.peoplefinderurl | http://people.tcd.ie/ivchvets | en |
dc.identifier.rssinternalid | 223037 | en |
dc.identifier.doi | https://doi.org/10.1038/s41699-020-00196-8 | en |
dc.relation.ecprojectid | info:eu-repo/grantAgreement/EC/FP7/881603 | |
dc.rights.ecaccessrights | openAccess | |
dc.subject.TCDTheme | Nanoscience & Materials | en |
dc.subject.TCDTag | NANOSTRUCTURES | en |
dc.subject.TCDTag | Nanotechnology | en |
dc.subject.TCDTag | SEMICONDUCTOR DEVICES AND MATERIALS | en |
dc.identifier.rssuri | https://doi.org/10.1038/s41699-020-00196-8 | en |
dc.status.accessible | N | en |
dc.contributor.sponsor | Science Foundation Ireland (SFI) | en |
dc.contributor.sponsorGrantNumber | PI_15/IA/ 3131 | en |
dc.contributor.sponsor | Science Foundation Ireland (SFI) | en |
dc.contributor.sponsorGrantNumber | PI_12/IA/1264 | en |
dc.contributor.sponsor | Irish Research Council for Science and Engineering Technology (IRCSET) | en |
dc.contributor.sponsorGrantNumber | IRCLA/2019/171 | en |
dc.contributor.sponsor | Irish Research Council (IRC) | en |
dc.contributor.sponsorGrantNumber | GOIPD/2018/653 | en |
dc.contributor.sponsor | European Commission | en |
dc.contributor.sponsorGrantNumber | 881603 | en |
dc.contributor.sponsor | Science Foundation Ireland (SFI) | en |
dc.contributor.sponsorGrantNumber | 2/RC/2278_P2 | en |
dc.contributor.sponsor | BMBF | en |
dc.contributor.sponsorGrantNumber | 16ES1121 | en |
dc.contributor.sponsor | Science Foundation Ireland (SFI) | en |
dc.contributor.sponsorGrantNumber | 15/SIRG/3329 | en |
dc.identifier.uri | http://hdl.handle.net/2262/94763 | |