Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-frame Data Fusion
Citation:
O'Leary, C., Haas, B., Koch, C., Nellist, P., & Jones, L. (2021). Increasing Spatial Fidelity and SNR of 4D-STEM Using Multi-Frame Data Fusion. Microscopy and Microanalysis, 1-11Download Item:
Abstract:
4D-STEM, in which the 2D diffraction plane is captured for each 2D scan position in the scanning transmission electron microscope
(STEM) using a pixelated detector, is complementing, and increasingly replacing existing imaging approaches. However, at present the
speed of those detectors, although having drastically improved in the recent years, is still 100 to 1,000 times slower than the current
PMT technology operators are used to. Regrettably, this means environmental scanning-distortion often limits the overall performance
of the recorded 4D data. Here, we present an extension of existing STEM distortion correction techniques for the treatment of 4D data
series. Although applicable to 4D data in general, we use electron ptychography and electric-field mapping as model cases and demonstrate
an improvement in spatial fidelity, signal-to-noise ratio (SNR), phase precision, and spatial resolution
Sponsor
Grant Number
Science Foundation Ireland (SFI)
URF/RI/191637
Science Foundation Ireland (SFI)
AMBER2-12/RC/2278_P2
Science Foundation Ireland (SFI)
182087777
Author's Homepage:
http://people.tcd.ie/jonesl1Description:
PUBLISHED
Author: Jones, Lewys
Sponsor:
Science Foundation Ireland (SFI)Science Foundation Ireland (SFI)
Science Foundation Ireland (SFI)
Type of material:
Journal ArticleCollections
Series/Report no:
Microscopy & Microanalysis;Availability:
Full text availableKeywords:
4D data, scanning transmission electron microscope, pixelated detector, 4D-STEM, Center-of-mass imaging, Electron ptychography, Scan-distortion correctionDOI:
http://dx.doi.org/10.1017/S1431927621012587Metadata
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