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dc.contributor.authorJones, Lewys
dc.date.accessioned2022-03-07T15:09:27Z
dc.date.available2022-03-07T15:09:27Z
dc.date.issued2020
dc.date.submitted2020en
dc.identifier.citationDe Wael, A. and De Backer, A. and Jones, L. and Varambhia, A. and Nellist, P.D. and Van Aert, S., Measuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopy, Physical Review Letters, 2020 Mar 13;124(10):106105en
dc.identifier.otherY
dc.description.abstractWe propose a new method to measure atomic scale dynamics of nanoparticles from experimental high-resolution annular dark field scanning transmission electron microscopy images. By using the so-called hidden Markov model, which explicitly models the possibility of structural changes, the number of atoms in each atomic column can be quantified over time. This newly proposed method outperforms the current atom-counting procedure and enables the determination of the probabilities and cross sections for surface diffusion. This method is therefore of great importance for revealing and quantifying the atomic structure when it evolves over time via adatom dynamics, surface diffusion, beam effects, or during in situ experiments.en
dc.language.isoenen
dc.relation.ispartofseriesPhysical Review Letters;
dc.relation.ispartofseries124;
dc.relation.ispartofseries10;
dc.rightsYen
dc.subjectnanoparticlesen
dc.subjectscanning transmission electron microscopy imagesen
dc.subjectdark fielden
dc.titleMeasuring Dynamic Structural Changes of Nanoparticles at the Atomic Scale Using Scanning Transmission Electron Microscopyen
dc.typeJournal Articleen
dc.type.supercollectionscholarly_publicationsen
dc.type.supercollectionrefereed_publicationsen
dc.identifier.peoplefinderurlhttp://people.tcd.ie/jonesl1
dc.identifier.rssinternalid224343
dc.identifier.doihttp://dx.doi.org/10.1103/PhysRevLett.124.106105
dc.rights.ecaccessrightsopenAccess
dc.identifier.orcid_id0000-0002-6907-0731
dc.identifier.urihttp://hdl.handle.net/2262/98248


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