Investigation of electronic structure and optical properties of organic molecular semiconductor materials by X-ray spectroscopies
Citation:
Nikolaos Peltekis, 'Investigation of electronic structure and optical properties of organic molecular semiconductor materials by X-ray spectroscopies', [thesis], Trinity College (Dublin, Ireland). School of Physics, 2009, pp 190Download Item:
Abstract:
The electronic structure of thin films of several members of the metal phthalocyanine
(MPc) and metal chelate families of organic molecular semiconductors have been
studied using resonant soft x-ray emission spectroscopy, x-ray absorption spectroscopy, photoemission spectroscopy and x-ray excited optical luminescence spectroscopy. Prolonged exposure of any organic molecule to ultraviolet or x-ray light induces damage in the molecular structure, typically referred to as beam damage.
Author: Peltekis, Nikolaos
Advisor:
McGuinness, CormacPublisher:
Trinity College (Dublin, Ireland). School of PhysicsNote:
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Physics, Ph.D., Ph.D. Trinity College Dublin.Metadata
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