Investigation of electronic structure and optical properties of organic molecular semiconductor materials by X-ray spectroscopies

Abstract

The electronic structure of thin films of several members of the metal phthalocyanine (MPc) and metal chelate families of organic molecular semiconductors have been studied using resonant soft x-ray emission spectroscopy, x-ray absorption spectroscopy, photoemission spectroscopy and x-ray excited optical luminescence spectroscopy. Prolonged exposure of any organic molecule to ultraviolet or x-ray light induces damage in the molecular structure, typically referred to as beam damage.